HeliOptics WLI5

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Heliotis 3D Industrial Camera

HeliOptics WLI5

heliOpticsTM WLI5 - Compact Mirau-Interferometer Module

Based on the highest resolution 3D-measurement technique of white-light interferometry, the WLI5 optics module offers unprecedented flexibility for integration with your metrology system. Its compact dimensions, small weight, and robust optical design enable a variety of interferometer config-urations and allow for use of small and cost effective linear motors.

With a vertical resolution down to nanometers and lateral resolutions down to 0.8 micrometer, the WLI5 is particularly suited for high-precision surface characterization and for measuring geometrical features such as step heights, co-planarity or flatness with extreme accuracy.

In combination with Heliotis’ smart pixel 3D-camera heliCam™ C3, as well as a range of interchangeable lenses, turn-key 3D-metrology is available in custom-tailored configurations and application specific lateral magnifica-tions. As the fastest scanning white-light interferometer, the WLI5/C3 configu-ration is ideally suited for integration into machines that inspect electronic components and packages, micro-mechanics, MEMS, micro-optics or sem-iconductors.

Features

  • surface topography down to nanometers
  • measures any surface
  • designed for inspection machines
  • fast and vibration resistant
  • multiple field of views / lateral resolutions
  • software modules for rapid integration (Windows, Mac, Linux)

Applications

 

MEMS structure

 

 

silicon trenches, 40 to 100 nm deep

 

HeliOptics WLI5

 

 WLI interferometer  Mirau configuration, exchangeable objectives (10x, 20x, 50x)
 light source  high power LED
 field of view (*)  232x222 μm  580x556 μm  1160x1112 μm
 numerical aperture  0.5  0.4  0.3
 working distance  2.52 mm  3.57 mm  3.57 mm
 vertical resolution (*) (single meas., RMS)  50 nm 1 nm in phase mode  70 nm 1 nm in phase mode  100 nm 1nm in phase mode
 vertical scan speed (*)  up to 50 mm per second
 lateral resolution (*)  0.8 μm  2 μm  4 μm
 reflectivity of sample (*) < 0.1% to 100%